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JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Estimated Packed Shipping Dimensions: L

SKU: 90570554253
4.7
EUR455.62 EUR501.62

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Shipping Estimate
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Ships within 48 hours · Estimated delivery Oct 26 - Oct 31

Description

Estimated Packed Shipping Dimensions: L x W x H = 18"x18"x18" @ 9 lbs

3 is used working surplus

Inventory # AA-3790

img{max-width:100%}img{max-width:100%} ASML 4022 471 4042 Circuit Board Used Working

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Estimated Packed Shipping Dimensions: LJEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
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